By using four-point probe, measure the Sheet Resistance of different kinds of conductors, semi-conductor in sheet, film, or bulk form. The high-accuracy four-point probe station combined with automatic needle drop and controlled needle force, accurate SMU (Source Measure Unit) provides high quality, easy to use system to measure the Sheet Resistance of thin film materials for various industrial fields such as semi-conductor, solar panel, OLED, MEMS, Fuel Cells, etc.

System Features：

• Intuitive and easy to use software user interface (UI).
• Automatic needle drop with 100g micro force feedback.
• Accurate measuring the sheet resistance of sample.
• Single or multiple point measuring under constant current.
• Derive the Bulk Resistivity and Conductivity by input the thickness of sample.
• Saving test data by .CSV format for easily handling data.
• Operate with Keithley 2400 SMU by default. Capable of customize software for various SMUs and ohmmeters.