Product & Service
Hi-Drop Tester II
Hi-Drop Tester improves testing efficiency：
Hi-Drop Tester is a high speed-multi channel resistance measuring system designed for PCB drop test according JEDEC standards by ChiefSI. The max sampling rate per channel of Hi-Drop Tester is 1MS/s with 16-bit resolution. The ability of anti-noise assures the accuracy of data measuring. The system is able to measure with drop tester synchronously and the NG condition of each channel can be set independently. The Hi-Drop Tester can also log events and testing waveform automatically.
System feature：
- High speed resistance measuring with 1MS/s sampling rate/channel.
- High spec PXI measuring system, up to 64-channel.
- Automatic NG judgment according to JEDEC criteria.
- High accuracy and anti-noise ability.
- Automatically test with currently existing drop tester.
- Measuring the resistance and acceleration above 10000 g combine with the accelerometer module.
- Measuring the resistance and strain synchronously combine with strain module.
- Real-time analysis for peak acceleration, velocity and duration.
- Trend analysis for several drop tests.
- Instantaneously data showing, logging, analysis and report generation.
| Platform | PXI Express |
real time NG judgment |
| Numbers of Slots | 8 | |
| Channels | 4N (N ≦ 16), Max. 64 channels | |
| Sampling Rate | Max. 50kS/ch (@16 ch) | |
| Trigger Sampling Rate | Max. 1 MS/Ch | |
| Resistance Measuring Resolution | 16 bit | |
| Resistance Measuring Range | 20Ω, 100W, 1kW, 10kW, 100 kΩ, 1MΩ, 10MΩ*note1 | |
| Resistance Waveform Logging | Support | |
| Long Time Logging | Support | |
| Measuring Method | Continuous & external trigger acquisition |
Analysis acceleration, speed and duration. |
| NG Criteria | Setup independently for each channel | |
| Fail Criteria for each Channel | Flexible (X Drop with Y NG) | |
| Trig Synchronously with Drop Tester | Support | |
| Filter Functions | Low pass, High pass, Band pass | |
| Cutoff frequency set independently for each channel. | ||
| Statistical Computing | Support | |
| Virtual Channel | Support | |
| Chart Format | Y-T Graph, X-Y Graph, Bar Chart, Trend | |
| Event Logging | Support | |
| Report Export Format | EXCEL, ASCII |
Trend analysis for several drop tests. |
| External Trigger Module | High speed photoelectric sensor | |
| High-G Accelerometer(Option) | Support IEPE, Charge or Bridge Type accelerometer. | |
| Analysis peak acceleration, speed &duration. | ||
| Trend analysis for several drop tests. | ||
| Auto Drop Altitude Feedback(Option) | Support | |
| Language | English | |
| Monitor Requirement | 1280×768 resolution | |
| Operation System | Windows XP, WIN7, WIN8, WIN10 |
Note1：10MΩ measuring range when measuring voltage up to 10V
Options：
- High-G accelerometer：10000 g、20000 g
- Accelerometer module：1MS/s/Ch, max 4 ch.
- Strain measuring module：100 kS/s/Ch, max 8Ch.
If you are interesting this products, please download the catalog now. A sales representative will contact with you as soon as possible
© 2019 Chief SI INC. - Design By Armlet