Rapid, Intuitive Four-Point Probe Sheet Resistance Measurement:
By using four-point probe, measuring the Sheet Resistance of different kinds of conductor, semi-conductor in sheet, film or bulk form. The high accuracy four-point probe station combined with a rapid, accurate SMU (Source Measure Unit) provides a high quality, easy to use system to measure the Sheet Resistance of thin film materials for various industrial fields such as semi-conductor, solar panel, OLED, MEMS, Fuel Cells, etc.
System Features:
Chuck size | 6”,8”,12” | Measure item | Sheet Resistance,Bulk Resistivity, Conductivity |
Sample geometry | Circle or Square | Interface | RS-232 or GPIB |
Head Up/Down | 16mm | Language | English |
Correct factor | Thickness & Geometry | PC Requirements | CPU:P4,HD:1GB,USB2.0 |
Probe Pin Material | BeCu(or Tungsten Carbide) | Monitor Requirements | 1280*800 resolution |
Probe Pin Spacing | 40mil,50mil,62.5mil | O.S. Supported | Windows XP,WIN7, WIN10 |
Probe Pin Spring | 45grams,85grams,180grams | SMU Support | Keithley 2400/2401 |
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